Development of generic testing strategies for mixed-signal integrated circuits
نویسندگان
چکیده
منابع مشابه
Development of generic testing strategies for mixed-signal integrated circuits - Circuits, Devices and Systems, IEE Proceedings G
The paper describes work at the Polytechnic of Huddersfield on SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey Semiconductors, Wolfson Microelectronics, and UMIST. The aim of the work is to develop generic testing strategies for mixed-signal (mixed analogue and digital) integrated circuits. The paper proposes a test structure for mixed-signal ICs, and details ...
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ژورنال
عنوان ژورنال: IEE Proceedings G Circuits, Devices and Systems
سال: 1992
ISSN: 0956-3768
DOI: 10.1049/ip-g-2.1992.0038